
| Two registration schemes of Scanning Near-field Optical Microscope |
| Results obtained on SNOM head |
| A Shear-force mechanism is widely used to regulate fiber tip-sample separation in SNOM. In our SNOM construction we are using a tuning fork with attached tapered fiber and piezoelectric element to apply lateral vibration to the system: A Q-factor of tuning fork without fiber is commonly 104 2x104 (in air), after attaching the tapered fiber Q-factor decreases to 103 5x103. Usually a resonant frequency changes weakly (it is about 32 kHz for the first resonant pike and 190 kHz for the second resonant pike). A electrical response of tuning fork is used to control the tip-sample separation and for measuring an AFM profile. At the same time it's possible to record the optic signal from light-conducting fiber by means of photoelectric device or photodiode while the scanning progress. The SNOM resolution capability (AFM-resolution and optical resolution) depends on the light-conducting fiber point curvature radius and on the probe-oscillation amplitude. We have obtained 50nm AFM resolution | ![]() Sear Force head of Solver-P47 |
(Shear force microscope) using own light-conducting fiber.
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