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SFM image of silicon nitride cantilever on TGT01 test grating. 1.6x1.4 um scan size.
| The conditions of the measurument |
| Date | 22-Aug-1996 |
| Device | Solver-P4 (16 bit DAC, scanning area 7um x 7um) |
| Mode | SFM resonant mode |
| Probe | Gold coated silicon nitride cantilever with curve radius 20nm. |
Image courtesy of S.Nesterov, NT-MDT, Moscow, Russia.
Non published.
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